NXP Semiconductors
BAS21AVD
High-voltage switching diodes
BAS21AVD
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? NXP N.V. 2013. All rights reserved
Product data sheet
1 August 2013
3
/
11
Symbol
Parameter
Conditions
Min
Max
Unit
Per device; one diode loaded
[1]
-
250
mW
Ptot
total power dissipation
Tamb
≤ 25 °C
[2]
-
295
mW
Tstg
storage temperature
-65
150
°C
Tj
junction temperature
-
150
°C
Tamb
ambient temperature
-65
150
°C
[1]
Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard
footprint.
[2]
Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for cathode 1 cm2.
9.
Thermal characteristics
Table 6.
Thermal characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Per device; one diode loaded
[1]
-
-
500
K/W
Rth(j-a)
thermal resistance
from junction to
ambient
in free air
[2]
-
-
425
K/W
Rth(j-sp)
thermal resistance
from junction to solder
point
[3]
-
-
140
K/W
[1]
Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
[2]
Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for cathode 1 cm2.
[3]
Soldering point of cathode tab.
10.
Characteristics
Table 7.
Characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Per diode
IF
= 100 mA; T
amb
= 25 °C
-
-
1
V
VF
forward voltage
IF
= 200 mA; T
amb
= 25 °C
-
-
1.25
V
VR
= 200 V; pulsed; t
p
≤ 300 μs;
δ
≤ 0.02 ; T
amb
= 25 °C
-
25
100
nA
IR
reverse current
VR
= 200 V; T
j
= 150 °C
-
-
100
μA
Cd
diode capacitance
f
= 1 MHz; V
R
= 0 V; T
amb
= 25 °C
-
0.6
5
pF
trr
reverse recovery time
IF
= 30 mA; I
R
= 30 mA; T
amb
= 25 °C;
RL
= 100 Ω; I
R(meas)
= 3 mA
-
16
50
ns